VLSI Test Principles and Architectures

Design for Testability

Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen
eISBN-13: 9780080474793

eBook Features

Already purchased in store?
Rent or Buy from $ 84.47 USD
Note: We do not guarantee supplemental material with textbooks (e.g. CD's, Music, DVD's, Access Code, or Lab Manuals)

Additional Book Details

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Sold By Elsevier Science
ISBNs 9780123705976, 9780123705976, 9780080474793, 0080474799
Language English
Number of Pages 809